Advances in Imaging and Electron Physics, Volume 193
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Peter W. Hawkes | 2016 | ISBN: 0128048158 | English | 154 pages | PDF | 13,2 MB
Advances in Imaging & Electron Physics merges two long-running serials — Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
The two chapters that fill this volume describe tools for studying the brightness of electron beams and for analyzing the properties of mass spectrometers.
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